IIT College of Psychology
Nambury S. Raju Lecture Series
John C. Scott, COO, APTMetrics, Inc.
Emerging Trends in Leadership Assessment
Friday, March 8, 2013
Rapid advancements in measurement technology and the explosive growth of the internet have led to a paradigm shift in the way we design and deliver leadership assessments. Technology-enabled assessment tools can be designed as theatrical, first-person stories—complete with a compelling organizational and situational backstory—to effectively measure potential, readiness and fit for leadership roles. This presentation will describe how technology-driven, immersive simulations can be effectively architected to help organizations fulfill their commitment to a robust and diverse talent pipeline for leadership positions.
Hermann Hall, Alumni Lounge
3241 South Federal
Chicago, IL 60616
Reception to follow
RSVP by Tuesday, March 5, 2013
Lauren Shelby at 312.567.5030 or firstname.lastname@example.org or by clicking the button at the top of the page.
John C. Scott
John C. Scott, Ph.D. is chief operating officer of APTMetrics, Inc., a global human resources consulting firm that designs sophisticated Talent Management solutions for Fortune® 100 companies and market innovators. As an alumnus of IIT’s Industrial/Organizational Psychology program in 1985, John has more than 25 years of experience designing and implementing human resources systems across a variety of global, high-stakes settings.
John is co-editor of an award-winning handbook entitled Handbook of Workplace Assessment: Selecting and Developing Organizational Talent. He is also co-editor of The Human Resources Program Evaluation Handbook and co-author of Evaluating Human Resources Programs: A 6-Phase Approach for Optimizing Performance. John is a fellow of the Society for Industrial & Organizational Psychology and the American Psychological Association, serves as an APA Council Representative, is SIOP’s main representative to the United Nations, and is a member of the Board of Directors for Boys Town in New York.